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Novel methods for characterizing electrochemical reactions occurring during battery operation at the nanoscale are highly required for understanding the fundamental working principle and improving the performance of the devices. In this work, we combined Ar ion milling under non-atmospheric conditions with in situ cross-sectional Kelvin probe force microscopy KPFM for direct imaging of the internal electrical potential distribution of the SS-LIBs.

We succeeded in the direct visualization of the change in the potential distribution of a cathode composite electrode a mixture of the active materials, solid electrolytes, and conductive additives arising from battery charging electrochemical reaction. The observed results provided several insights into battery operation, such as the behavior of Li ions and inhomogeneity of electrochemical reactions in the electrode. Our method paves the way to characterize the fundamental aspects of SS-LIBs for the improvement of device performance, including the evaluation of the distribution of the Li ion depleted regions, visualization of the conductive paths, and analysis of the cause of degradation.

The article was received on 11 Oct , accepted on 28 Nov and first published on 30 Nov Material from this article can be used in other publications provided that the correct acknowledgement is given with the reproduced material and it is not used for commercial purposes.

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All Journals. New Titles. He is co-author of international publications, contributed several book chapters, co-edited the first volume of the book on Kelvin probe force microscopy KPFM , and has more than contributions to international scientific conferences. His work is now focused on the development of instruments and measurement techniques for high resolution scanning probe microscopy and the analysis of molecules and insulating and semiconducting surfaces at the nanometer scale.

The expertise of the group is clearly focused on the nanoscale analysis and preparation of highly ordered surfaces down to the molecular and atomic scale, however with a focus on optoelectronic processes. Experimental technique and working modes Th. Glatzel, S. Sadewasser 3.

‎Kelvin Probe Force Microscopy on Apple Books

Miyahara 4. KPFM techniques for liquid environment K. Kobayashi 5. Kalinin, S.

Jesse 6. Wijngaarden 7. KPFM with atomic resolution Y. Sugawara 8. Local dipoles in atomic and Kelvin probe force microscopy R. Perez Jelinek Modelling the electrostatic field of a cantilever Ch.

  • Standardization of surface potential measurements of graphene domains.
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Loppacher, L. Kelvin spectroscopy of single molecules L. Optoelectronic properties of single molecules T.

Meier, Th. KPFM of organic solar cell materials B. Correlation of optical and electrical nanoscale properties of organic devices D. Quantitative electrical measurements of SiC devices U. Gysin, Th. Louis USA. Sascha's research focuses on the development of nanostructures for and of chalcopyrite materials for the improvement of solar cells.

The role of the cantilever in Kelvin probe force microscopy measurements

He is an expert on scanning probe microscopy, and specifically Kelvin probe force microscopy, applied to semiconductor and solar cell research. His work has provided important insights into the physics of grain boundaries in polycrystalline Cu in,Ga Se2 thin-film solar cells. He has published over 80 peer-reviewed papers and 5 book chapters, and has been granted 3 patents.

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